Theoretical Evaluation of Selective Radiation–Absorbing Surface

Abstract

An algol computer program is described, by means of which the spectral reflectivity for any angle of incidence may be calculated for a surface consisting of up to two thin absorbing films on a bulk substrate. The values of optical constant, n and k, for the materials used and also the thickness of the films, are the only data required. Calculated reflectivities have been shown to be consistent with experimental results.