Theoretical Evaluation of Selective Radiation–Absorbing Surface

Authors

  • K.R. O’shea Department of Physics, University of Dar es Salaam, Tanzania

Abstract

An algol computer program is described, by means of which the spectral reflectivity for any angle of incidence may be calculated for a surface consisting of up to two thin absorbing films on a bulk substrate. The values of optical constant, n and k, for the materials used and also the thickness of the films, are the only data required. Calculated reflectivities have been shown to be consistent with experimental results.

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Published

1975-07-31

Issue

Vol. 1 No. 2 (1975)

Section

Articles

License

Authors who publish in The Eastern Africa Law Review retain the copyright to their work and grant the University of Dar es Salaam a non-exclusive license to publish, reproduce, and distribute the article.

This article is published under the Creative Commons Attribution 4.0 International (CC BY 4.0) License, which permits unrestricted use, distribution, adaptation, and reproduction in any medium, provided the original work is properly cited.